Effects of Sn doping density and multiple layer deposition on the structural, optical and electrical properties of ZnO films prepared by spin-coating sol gel method, have been investigated. Film characteristics have been studied using X-ray diffraction (XRD), electronic absorption (UV visible) spectroscopy, atomic force microscopy (AFM) and the four-probe method. In both 5- and 10-layered ZnO films, XRD patterns confirm Sn substitutional incorporation, where the Sn4+ ions replace the Zn2+ ions while preserving the hexagonal wurtzite structures. The results show that both doping density and number of layers affect crystallite size, film thickness, conductivity and surface morphology, where doping density of 1.5 to 2 at% show films with preferred characteristics. Among different films, the 10-layered film that is doped with 1.5 at% Sn exhibits preferred properties in terms of the root mean square (RMS) surface roughness value (5.1055 nm), the average transmittance (93%) and notably the conductivity (7.94x10-3 Ω-1.Cm-1).