The Atomic Microscope can be used for Measuring the Potential Drop Across A PN- Junction with Submicrometer Precision
- Publication Type
- Original research
- Authors
- Zeid Qamhieh
Journal
- Title
- --
- Publisher
- --
- Publisher Country
- Palestine
- Publication Type
- Both (Printed and Online)
- Volume
- --
- Year
- 1994
- Pages
- --