X-Ray Photoelectron Spectroscopic Measurements on Glassy Ge20S80−Xbix (X=0,16)
- Publication Type
- Original research
- Authors
- G. Saffarini
- J. M. Saiter
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X-ray photoelectron spectroscopy measurements have been performed on n-type Bi-modified Ge20S64Bi16 glass. The observed chemical shifts show that Bi is incorporated as a positive charged center into the matrix of Ge20S80 parent glass.
Journal
- Title
- Materials Letters, Volume 46, Issue 6, December 2000, Pages 327-331
- Publisher
- --
- Publisher Country
- Palestine
- Publication Type
- Both (Printed and Online)
- Volume
- --
- Year
- 2000
- Pages
- --