Thermal analysis (TA) that incorporates image analysis can be a powerful online tool for estimating degree of silicon modification in cast test samples. This work is a review of different articles, that elaborate this subject from different perspectives. The goal of the study outlined in the one of the article was on-line quantitative control of aluminum-silicon modification level using thermal analysis. The other articles examined the effect of strontium fading on the size and shape of silicon particles in the 319 aluminum alloys. Measurements of the size of silicon particles formed during solidification were used to quantity strontium fading. In the other article, the influences of strontium on the silicon modification and aluminum-copper eutectic microstructures in the 319-aluminum alloy were examined. The strontium levels considered were between 8 and 96 ppm. The goal of work discussed in the fourth article is to demonstrate the possibility to quantify and to characterize the development of Cu enriched phases in the 3xx series and aluminum alloys using the thermal analysis. While the analysis of the effects of the elements on eutectic nucleation and growth temperatures and the decalescence shows two different trends. Addition of Ba and Yb both causes linear changes with increased concentration, while addition of Ca and Y result in an instantaneous effect with the first addition and no farther significant with increased concentration.

Title

J. of Active and Passive Electronic Devices, Vol. 2, pp. 1-9

Publisher

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Publisher Country

Palestine

Publication Type

Both (Printed and Online)

Volume

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Year

2007

Pages

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