Scanning electron microscopy has become a popular imaging tool in different areas of science and engineering [1–7]. Being able to elucidate the structure of a material at the micro-and/or the nano-scale level is indeed crucial to characterizing the material, understanding its mechanism and mode of formation, and explaining/predicting its properties and performance under a given set of environmental or load conditions [1, 2, 3, 8,9]. Secondary electron imaging is commonly used to reveal surface topography, grain ...

see the attached file

Title

Application Note # 5991-0791EN, Agilent Technologies, Inc., 2012, 8p.

Publisher

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Publisher Country

Palestine

Publication Type

Both (Printed and Online)

Volume

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Year

2012

Pages

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