X-ray photoelectron spectroscopy measurements have been performed on n-type Bi-modified Ge₂₀S₆₄Bi₁₆ glass. The observed chemical shifts show that Bi is incorporated as a positive charged center into the matrix of Ge₂₀S₈₀ parent glass.

العنوان

Materials Letters, Volume 46, Issue 6, December 2000, Pages 327-331

الناشر

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بلد الناشر

فلسطين

نوع المنشور

Both (Printed and Online)

المجلد

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السنة

2000

الصفحات

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