This work aims to tailor the optical and radiation protection parameters of PVA-PVP blend using SiC-Cu2O nanocomposite (NC) for innovative applications. SiC-Cu2O NC doped PVA-PVP films were equipped by a solution casting process. The surface morphology, structural changes, chemical bonding, and optical performance were fully characterized by SEM, optical microscopy, FT-IR, EDX, and UV–visible spectrophotometry techniques. The SEM and FTIR investigations confirm the effective incorporation and integration between the SiC-Cu2O NCs and the PVA-PVP matrix. The UV–visible examination reveals that the direct (indirect) bandgap (Eg) of the PVA-PVP matrix decreases due to SiC-Cu2O NCs doping. In addition, the doping of SiC-Cu2O NCs significantly enhances the refractive index (n) and dielectric parameters of the PVA-PVP matrix. The radiation shielding properties were determined by the Phy-X/PSD program. The shielding investigations reveal that to SiC-Cu2O NCs enhance significantly all the radiation protection parameters, including the linear and mass attenuation coefficients (LAC, MAC), mean free path (MFP), half- and tenth-value layers (HVL, TVL), and effective atomic number (Zeff). Comprehensively, the findings in this paper indicate that SiC-Cu2O doped PVA-PVP films are promising candidates in optical and radiation protection technologies.
